Proceedings of JSPE Semestrial Meeting
2018 JSPE Spring Conference
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Development of two-beam interference exposure for X-ray grating -Improvement of fabrication accuracy-
*Yuh KamataJianli GuoKeiichi NakagawaHidekazu Mimura
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 601-602

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[in Japanese]
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© 2018 The Japan Society for Precision Engineering
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