1998 年 6 巻 6 号 p. 74-81
In this case, a new approach for appearance defect inspection using Mahalanobis-Taguchi System was applied. Images from a group of "good" (normal) products were transformed into wave patterns. From these normal patterns, "differential characteristic" and "integral characteristic" data were picked up. A Mahalanobis space was constructed using these data. Then, the image of a product to be inspected was transformed into a group of wave patterns, and the differential and integral characteristics were picked up from the patterns. The data from these characteristics were calculated with the said Mahalanobis Space to obtain a Mahalanobis Distance. This is the distance showing the deviation from the good products, and is used to distinguish a defective from good products.
