溶接学会論文集
Online ISSN : 2434-8252
Print ISSN : 0288-4771
隣接2線走査法の原理と縦長画素の採用による精度向上
隣接2線走査法による周囲長計測(第1報)
中島 勝行大淵 豊井上 勝敬
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ジャーナル フリー

1990 年 8 巻 4 号 p. 470-475

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A new algorithm for perimeter measurement for a binary image has been developed. The adjacent two horizontal lines in the image are scanned simultaneously in this algorithm, therefore it is named as DLS(Dual Lines Scanning) method. Its performance is very fast, so suitable for real time measurement, and also its construction is so simple that hardware design is easy.
It is proved that the accuracy of measurement in this method increases by employing rectangular pixel with large vertical-horizontal ratio through experimental analysis. This fact is opposed to the intuitive common sense, then the consideration is made on that cause. The simulation is also made on the characteristics of measurement for the simple figure image.
As the conclusion, this algorithm is very useful for industrial application, especially for measuring moving objects because of the high-speed and simple configuration.

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