抄録
In starch science, X-ray diffraction (XRD) has been solely used for the evaluation of starch type and/or the content of crystalline and non-crystalline (amorphous) materials in starch. However, XRD allows us to estimate the crystalline regularity and deficit. In this study, we newly propose a “crystalline index” of starch that was introduced by peak height and the full-width at half maximum (FWHM) by means of XRD to evaluate the destruction or discrimination of amylose and amylopectin in the starch production process of plants. Amylose, amylopectin, corn, potato and sago starch samples were used in this study. The crystalline index of amylose, amylopectin and other starch samples ranged from 609 to 1266, in the order of amylose > amylopectin > corn > potato > sago.
https://ror.org/00b45dj41 
