Proceedings of the Annual Conference of the Institute of Systems, Control and Information Engineers
The 50th Annual Conference of the Institute of Systems, Control and Information Engineers
Session ID : 4W4-3
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Host: The Institute of Systems, Control and Information Engineers

Parameter Tuning Approach of One Class SVM for Product Inspection
Gaussian Kernel Parameter Selection by Cluster Shape Analysis
*Kojitani Kazuto, Hiroshi Tasaki, Hiroshi Nakajima
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Keywords: product inspection, learning, pattern classification
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Abstract
To realize automated product inspection with using single classification modeling, it is necessary to acquire the classification model by using small number of normal sample data. In this article, the selection method of Gaussian kernel parameter is proposed by analyzing the cluster shape formed by SVM.
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© 2006 The Institute of Systems, Control and Information Engineers
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