Proceedings of the Annual Conference of the Institute of Systems, Control and Information Engineers
The 53nd Annual Conference of the Institute of Systems, Control and Information Engineers
Session ID : gs04
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Host: Institute of Systems, Control and Information Engineers

Sizing of Multiple Crack using Model Marginal Likelihoods in Eddy Current Testing
*Mitsuhiro Kikuchi, *Fumio Kojima
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[in Japanese]
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© 2009 The Institute of Systems, Control and Information Engineers
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