1998 年 49 巻 4 号 p. 401-406
Ferromagnetic Co-based metals were electroless-deposited into microstructured porous silicon (PS) pores. Perpendicular magnetic anisotropy changed in the electroless Co-B layer. Stronger layer anisotropy was obtained using a self-supporting PS as a substrate. Microstructure and magnetic properties of the metal layer were observed through a field emission scanning electron microscope (FE-SEM) and a vibrating sample magnetometer (VSM). Anisotropy was found due to the structure of the deposited layer. Higher coercivity of perpendicular magnetization curves was obtained in an electroless Co-Mn-P layer. This indicates the potential for applying this composite material to the perpendicular magnetic recording media.