Calibration and Characterization of 650 nm Silicon Narrow-band Radiation Thermometer

Fumihiro Sakuma; Laina Ma

doi:10.11499/sicep.2002.0.12.0

SICE Annual Conference 2002

DOI https://doi.org/10.11499/sicep.2002.0.12.0

会議情報

主催: The Society of Instrument and Control Engineers

共催: IEEE/Industiral Electronic Society, IEEE/Robotics and Automation Society, IEEE/Control System Society

Calibration and Characterization of 650 nm Silicon Narrow-band Radiation Thermometer

Fumihiro Sakuma, Laina Ma

著者情報

キーワード: radiation thermometer, calibration, temperature standard, fixed-point blackbody, spectral responsivity

会議録・要旨集フリー

p. 12

詳細

抄録

This paper describes the calibration and characterization of the 650 nm standard radiation thermometers used in the traceability system of radiation thermometers in Japan. NMIJ started in 2001 a new calibration service including the copper-point calibration, spectral responsivity and nonlinearity measurement. Characterization covers the size of source effect, distance effect, ambient temperature dependence, zero offset drift and long term stability.

責任著者(Corresponding author)

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