Analysis of the Wavelet-based Image Difference Algorithm for PCB Inspection

Zuwairie Bin Ibrahim; Syed Abdul Rahman Bin Al-Attas; Zulfakar Bin Aspar

doi:10.11499/sicep.2002.0.465.0

SICE Annual Conference 2002

DOI https://doi.org/10.11499/sicep.2002.0.465.0

会議情報

主催: The Society of Instrument and Control Engineers

共催: IEEE/Industiral Electronic Society, IEEE/Robotics and Automation Society, IEEE/Control System Society

Analysis of the Wavelet-based Image Difference Algorithm for PCB Inspection

Zuwairie Bin Ibrahim, Syed Abdul Rahman Bin Al-Attas, Zulfakar Bin Aspar

著者情報

キーワード: Industrial inspection, printed circuit board, wavelet

会議録・要旨集フリー

p. 465

詳細

抄録

The methodology and results regarding the use of wavelet transform and multiresolution analysis in automated visual printed circuit board (PCB) inspection provide the motivation for this research. In this paper, the wavelet-based image difference algorithm proposed is applied to a sample PCB image. The algorithm is applied by using Haar wavelet where several different numbers of levels are considered. One conclusion from this paper is that the second level Haar wavelet transform should be selected for the application of visual PCB inspection.

責任著者(Corresponding author)

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