計測自動制御学会論文集
Online ISSN : 1883-8189
Print ISSN : 0453-4654
ISSN-L : 0453-4654
ナノメータ変位計測光ファイバヘテロダイン干渉計プローブ
中谷 登山田 朝治阪部 俊也
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ジャーナル フリー

1989 年 25 巻 8 号 p. 841-846

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抄録
Optical fiber heterodyne interferometry with the following desirable features has been investigated to measure displacement of an object: it is extremely sensitive, noncontacting and has a linear relation between detector output and displacement. However, other systems have suffered from external disturbance because the reference light arm has a different path from the signal light arm. This paper describes the optical fiber heterodyne interferometer probe free from external disturbance in the optical paths of two fibers used to measure small displacement of an object. The external disturbance is excluded by differentiating the phases of the beat signals from two fibers, which include equal phase fluctuation in the fibers due to the disturbance. To improve the S/N ratio, we coated dielectric reflecting mirrors onto the output ends of the fibers. This probe sensor makes it posible to measure a small displacement of 0.1nm.
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