抄録
Moire topography has an advantage of measuring 3D shape of object using only one image. However, since classical moire topography can hardly discern orders of moire stripes, this method has difficulties in judging convex/concave of the object. Phase-shifting is an efficient method to solve the problem of judging the surface unevenness. This method is not only deliver a way to uneven shape but also improve the sensitivity. This method is, however, on condition that images of different phase have to be obtained, and this method cannot be calculated orders of discontinuous stripes.
In order to solve the above problems, we propose an intensity modulated moire topography. The key point is to use the intensity modulated light source. This method enables us to get the relationship between order and this intensity of moire stripe. Moreover, we can embed this method to slit-pattern projection method to calculate the order of slit-light and to judge an edge by only use fewer image.
