SPring-8/SACLA Research Report
Online ISSN : 2187-6886
Section B
Grazing Incidence X-ray Diffraction (GIXD) Measurement of Colloidal Organic Semiconductor Thin-Films Formed by a Electrospray Deposition Method
Yusuke TajimaTakaaki OriiHideaki TakakuAtsushi Kimoto
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Keywords: GIXD, 2012A1336, BL13XU
JOURNAL OPEN ACCESS

2013 Volume 1 Issue 3 Pages 134-137

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[in Japanese]
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