SPring-8/SACLA Research Report
Online ISSN : 2187-6886
Section B
Analysis of Si-MOS by Hard X-ray Photoelectron Spectroscopy under Bias
Keita Kataoka, Yukihiko Watanabe, Yasuji Kimoto, Kosuke Kitazumi
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Keywords: 2012B1287, BL46XU
JOURNAL OPEN ACCESS

2013 Volume 1 Issue 3 Pages 181-183

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[in Japanese]
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