SPring-8/SACLA Research Report
Online ISSN : 2187-6886
Section B
Trial Study of Evaluating Debye-Waller Factors for SiGe/Ge Thin Film Samples by Diffraction Anomalous Fine Structure I
Kosuke Fujiwara
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Keywords: 2019A2011, BL19B2
JOURNAL OPEN ACCESS

2024 Volume 12 Issue 1 Pages 37-40

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Abstract
[in Japanese]
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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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