X-ray Nano-beam Diffraction from Ga<sub>1-x</sub>In<sub>x</sub>N/GaN Five-quantum Shells Extracted by using Focused-Ion-Beam Microsampling

SPring-8/SACLA Research Report

Online ISSN : 2187-6886

Section A

X-ray Nano-beam Diffraction from Ga_1-xIn_xN/GaN Five-quantum Shells Extracted by using Focused-Ion-Beam Microsampling

Takao Miyajima, Takato Ichikawa, Tsurugi Kondo, Ryota Kobayashi, Koki Uno, Nobuhiro Yasuda, Yasuhiko Imai, Sakiko Enomoto, Shigeo Arai, Satoshi Kamiyama, Daichi Imai

Author information

Takao Miyajima
Meijo University
Takato Ichikawa
Meijo University
Tsurugi Kondo
Meijo University
Ryota Kobayashi
Meijo University
Koki Uno
Meijo University
Nobuhiro Yasuda
Japan Synchrotron Radiation Research Institute
Yasuhiko Imai
Japan Synchrotron Radiation Research Institute
Sakiko Enomoto
Nagoya University
Shigeo Arai
Nagoya University
Satoshi Kamiyama
Meijo University
Daichi Imai
Meijo University

Keywords: 2019A1539, BL40XU

JOURNAL OPEN ACCESS

2024 Volume 12 Issue 3 Pages 129-133

DOI https://doi.org/10.18957/rr.12.3.129

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Abstract

[in Japanese]

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