SPring-8/SACLA Research Report
Online ISSN : 2187-6886
Section B
Local Structure Analysis of Ion Implanted Si in GaN by X-ray Absorption Fine Structure
Takumi Yonemura, Junji Iihara, Shin Hashimoto, Yoshihiro Saito, Takao Nakamura
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Keywords: GaN, Si, Mg, XAFS, 2013A1540, BL27SU
JOURNAL OPEN ACCESS

2014 Volume 2 Issue 1 Pages 122-124

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[in Japanese]

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