SPring-8/SACLA Research Report
Online ISSN : 2187-6886
Section B
Enhancement of Dislocation Image in Silicon Single Crystal by X-ray Topography Using Digital Camera
Kentaro KajiwaraTakuya Matsumoto
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Keywords: 2011B1768, BL19B2
JOURNAL OPEN ACCESS

2015 Volume 3 Issue 2 Pages 397-402

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[in Japanese]
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