Published: August 16, 2018Received: March 17, 2017Available on J-STAGE: January 15, 2021Accepted: July 03, 2018
Advance online publication: -
Revised: -
We have carried out hard X-ray photoemission spectroscopy (HAXPES) measurement of the multilayer oxides on the Si(100) surface. Despite of many difficulties, we were able to acquire some data which provides us some further understanding of these buried oxide layers.
