SPring-8/SACLA Research Report
Online ISSN : 2187-6886
Section A
Local Structure Analysis of Isoelectronic Trap Impurities Improving Silicon-Based Tunnel Field-Effect Transistor
Takahiro Mori, Naoya Okada, Shigetomo Shiki
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Keywords: XAFS, 2017B1093, BL27SU
JOURNAL OPEN ACCESS

2021 Volume 9 Issue 1 Pages 60-63

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Abstract
[in Japanese]
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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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