Section A
Structural Analysis of Niobium Oxide Amorphous Films with Different O/Nb Prepared by Sputtering Method with Changing Oxygen Partial Pressure
Keywords:
Structural analysis,
Amorphous film,
Niobium oxide,
Valences,
Synchrotron radiation,
High-energy X-ray diffraction,
X-ray absorption fine structure,
Reverse Monte Carlo simulation,
2014A1631,
2014A1694,
2014B1732,
BL01B1,
BL46XU,
BL13XU
2021 Volume 9 Issue 5 Pages 278-282
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