粉体工学会誌
Online ISSN : 1883-7239
Print ISSN : 0386-6157
ISSN-L : 0386-6157
光の回折を利用した粒度測定とマイクロ・コンピュータによるデータ処理
山本 純雄鎌田 治佐藤 啓仁
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1981 年 18 巻 11 号 p. 797-802

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The optical method is of advantage in measuring particle size instantaneously and automatically, and the diffraction method is more sensitive to the particle configuration than the scatterring method.
A measuring apparatus using the diffraction method is constructed which has a simple structure to improve its reliability and has a circular aperture behind the sample cell to allow easy adjustment. It is easy to take in data at a high sampling rate because of the use of an electronic sampling method without mechanically moving parts, and the data aquisition is also carried out at high speed. But it is not necessary to display the size distribution, mean diameter and variance as fast as in sampling. The data are mostly processed with a microcomputer.
Using this apparatus, the measurement of particle size is carried out for spherical and aspherical samples. Furthermore, the measuring range of particle size is extended reasonably to some extent by means of simutaneously processing two independent signals of each particle which are proportional to the square of diameter.

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