Specific Synchrotron Radiation Facilities Research Report
Online ISSN : 2760-5434
Section A
Development of Scanning X-ray Back-Scattered Diffraction Microscope and Investigation for Crystalline Orientation Mapping Method
Keisuke IshigamiKazushi SumitaniKentaro KajiwaraRyo KatoJunichiro KidaRyo MaruyamaKohei UezatoMasataka SugiyamaTakafumi TsugawaShin TsukamotoRyuji TamuraYutaka MatsuuraTetsuya Nakamura
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JOURNAL OPEN ACCESS

2026 Volume 14 Issue 2 Pages 99-106

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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