抄録
This paper is concerned with material interrogation methods for homogeneous dielectric materials using stochastic inversion. Frequency dispersions for homogeneous dielectric materials can be described by the Debye formulation. Propagation in the dielectric medium is assumed to be governed by the time-dependent Maxwell’s equations in one spatial dimension. When a plane wave travelling in the free space hits the dielectric material, the reflective wave from the front edge of material is measurable at the free space. Thus the problem considered here is to quantify uncertainties of the estimated dielectric parameters from the measurements of electric field. A computational method using Hamiltonian Monte Carlo sampling based on nonlinear hierarchical models is tested.
