Abstract of annual meeting of the Surface Science of Japan
2015 International Joint Symposium on Recent Progress of Advanced Nanocharacterization
Session ID : 1P04
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Host: The Surface Science Society of Japan, The Vacuum Society of Japan

december1
Optical Properties of the AlN/TiN/AlN Nano Maltilayer Film by Sputtering
*Soiti Ogawa, Masatoshi Kondo, Akinori Ebe, Yoshiharu Kakehi, Yusuke Kondo
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[in Japanese]

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© 2015 The Surface Science Society of Japan
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