抄録
Formation and structure of single particle layer of organo-zinc oxide are investigated by surface pressure-area (π-A) isotherm, out-of-plane X-ray diffraction (XRD) analysis, and atomic force microscopy (AFM). In this study, solubilization technology of inorganic fine particles into general solvent have proposed and formation technology of single particle layer have established by using that inorganic solution as "spreading solution" of the interfacial film. The surface modification of ZnO is performed using long-chain carboxylic acid. Accordingly, it is easily achieve a regular arrangement of ZnO to overcome the relatively weak van der Walls interactions between the inorganic materials. A Langmuir monolayer of these particles is condensed. A multi-particle layered structure is constructed by the Langmuir-Blodgett (LB) technique. The results of the out-of-plane XRD measurements of the single particle layer for organo-ZnO clearly confirmed a sharp peak at 42 Å. This reflection have came from distance between ZnO in layer structure. AFM image of this single particle layer of organo-ZnO showed particle assembly with uniform height of 60 nm. These aggregated particles formed large two-dimensional crystal. That is to say, a regular periodic structure along the c-axis and condensed single particle layer have been fabricated by Langmuir and LB techniques.
