Abstract
This paper proposes an S-parameter analysis method that uses simultaneous excitation for multi-antenna systems. In this method, OFDM (Orthogonal Frequency Division Multiplexing) and CI (Carrier Interferometry) pulse generation schemes are employed for maintaining the orthogonality among the excited signals. In OFDM excitation schemes, the characteristics of the neighboring antennas can be calculated by assigning different frequency subcarriers exclusively. CI enables the simultaneous verification of the antennas distant enough since this method can provide temporal orthogonality. Combining these two methods yields the simultaneous analyses of array antennas with both narrow and wide element spacing. The simulation of a 2×2 multi-antenna shows that the results of the proposed method agree well with those of the conventional method even though its computation speed is more 4 times that of the conventional method.
