Experimental Investigation on Electromagnetic Immunity and Conduction Immunity of Digital Control Circuit Based on ARM

抄録

This paper analyzes the typical functions of digital control circuit and its function modules, and develops a set of digital control circuit equipment based on Advanced RISC Machines (ARM) with typical function modules, including principle design, interference injection trace design, function design, and study the failure mode and threshold of typical function modules. Based on continuous wave (CW) and pulse wave, the direct power injection (DPI) method is used to test the conduction immunity of the digital control circuit, and the failure mode and sensitivity threshold of the digital control circuit are quantitatively obtained. This method can provide experimental verification for the immunity ability of the digital control circuit to different electromagnetic interference.