IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Regular Section
A Single Event Effect Analysis on Static CVSL Exclusive-OR Circuits
Hiroshi HATANO
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ジャーナル 認証あり

2010 年 E93.C 巻 9 号 p. 1471-1473

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抄録
Single event transient (SET) effects on original static cascade voltage switch logic (CVSL) exclusive-OR (EX-OR) circuits have been investigated using SPICE. SET simulation results have confirmed that the static CVSL EX-OR circuits have increased tolerance to SET. The static CVSL EX-OR circuit is more than 200 times harder than the conventional CMOS circuit.
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© 2010 The Institute of Electronics, Information and Communication Engineers
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