Probing of Electric Field Distribution in ITO/PI/P3HT/Au Using Electric Field Induced Second Harmonic Generation

Ryo MIYAZAWA; Dai TAGUCHI; Takaaki MANAKA; Mitsumasa IWAMOTO

doi:10.1587/transele.E94.C.185

Special Section on Recent Progress in Molecular and Organic Devices

Probing of Electric Field Distribution in ITO/PI/P3HT/Au Using Electric Field Induced Second Harmonic Generation

Ryo MIYAZAWA ^†, Dai TAGUCHI ^†, Takaaki MANAKA ^†, Mitsumasa IWAMOTO ^†

著者情報

キーワード: electron trap, SHG, MIS, P3HT, C-V

ジャーナル認証あり

2011 年 E94.C 巻 2 号 p. 185-186

DOI https://doi.org/10.1587/transele.E94.C.185

詳細

抄録

By using electric field induced second harmonic generation (EFISHG) and Capacitance-Voltage (C-V) measurements, we studied carrier behaviors in ITO/polyimide (PI)/poly (3-hexylthiophene)(P3HT)/Au diodes. Photoillumination caused the threshold voltage shift in the C-V, and agreed well with the shift probed by the EFISHG. Results suggested trapped electrons were accumulated in the PI layer.

責任著者(Corresponding author)

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