IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Circuits and Design Techniques for Advanced Large Scale Integration
A Large “Read” and “Write” Margins, Low Leakage Power, Six-Transistor 90-nm CMOS SRAM
Tadayoshi ENOMOTONobuaki KOBAYASHI
著者情報
ジャーナル 認証あり

2011 年 E94.C 巻 4 号 p. 530-538

詳細
抄録
We developed and applied a new circuit, called the “Self-controllable Voltage Level (SVL)” circuit, to achieve an expanded “read” and “write” margins and low leakage power in a 90-nm, 2-kbit, six-transistor CMOS SRAM. At the threshold voltage fluctuation of 6σ, the minimum supply voltage of the newly developed (dvlp.) SRAM for “write” operation was significantly reduced to 0.11V, less than half that of an equivalent conventional (conv.) SRAM. The standby leakage power of the dvlp. SRAM was only 1.17µW, which is 4.64% of that of the conv. SRAM at supply voltage of 1.0V. Moreover, the maximum operating clock frequency of the dvlp. SRAM was 138MHz, which is 15% higher than that (120MHz) of the conv. SRAM at VMM of 0.4V. An area overhead was 0.81% that of the conv. SRAM.
著者関連情報
© 2011 The Institute of Electronics, Information and Communication Engineers
前の記事 次の記事
feedback
Top