Thickness of Crystalline Layer of Rubbed Polyimide Film Characterized by Grazing Incidence X-ray Diffractions with Multi Incident Angles

抄録

Thickness of crystalline layer induced by annealing after rubbing at surface of polyimide film for liquid crystal displays was estimated to be 3–5 nm by grazing-incidence X-ray diffractions with multi incident angles. Agreement of thickness of crystalline layer with that of initially oriented layer suggests polymer orientation induced by rubbing proceeds crystallization by annealing. Furthermore, no in-plane smectic ordering in bottom 20 nm region of polyimide film was suggested.