Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO

Junichiro KADOMOTO; So HASEGAWA; Yusuke KIUCHI; Atsutake KOSUGE; Tadahiro KURODA

doi:10.1587/transele.E99.C.659

Special Section on Analog Circuits and Related SoC Integration Technologies

Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO

Junichiro KADOMOTO, So HASEGAWA, Yusuke KIUCHI, Atsutake KOSUGE, Tadahiro KURODA

著者情報

キーワード: TCI, 3D integration, LC-VCO, EMI

ジャーナル認証あり

2016 年 E99.C 巻 6 号 p. 659-662

DOI https://doi.org/10.1587/transele.E99.C.659

詳細

抄録

This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

責任著者(Corresponding author)

J-STAGEへの登録はこちら（無料）