2020 Volume E103.D Issue 10 Pages 2125-2132
The recent development of semiconductor technology has led to downsized, large-scaled and low-power VLSI systems. However, the incidence of soft errors has increased. Soft errors are temporary events caused by striking of α-rays and high energy neutron radiation. Since the scale of VLSI has become smaller in recent development, it is necessary to consider the occurrence of not only single node upset (SNU) but also double node upset (DNU). The existing High-performance, Low-cost, and DNU Tolerant Latch design (HLDTL) does not completely tolerate DNU. This paper presents a new design of a DNU tolerant latch to resolve this issue by adding some transistors to the HLDTL latch.