Adversarial Metric Learning with Naive Similarity Discriminator

Abstract

Metric learning aims to generate similarity-preserved low dimensional feature vectors from input images. Most existing supervised deep metric learning methods usually define a carefully-designed loss function to make a constraint on relative position between samples in projected lower dimensional space. In this paper, we propose a novel architecture called Naive Similarity Discriminator (NSD) to learn the distribution of easy samples and predict their probability of being similar. Our purpose lies on encouraging generator network to generate vectors in fitting positions whose similarity can be distinguished by our discriminator. Adequate comparison experiments was performed to demonstrate the ability of our proposed model on retrieval and clustering tasks, with precision within specific radius, normalized mutual information and F₁ score as evaluation metrics.