On Fault Testing for Reversible Circuits

Abstract

It has been known that testing of reversible circuits is relatively easier than conventional irreversible circuits in the sense that few test vectors are needed to cover all stuck-at faults. This paper shows, however, that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit using a polynomial time reduction from 3SAT to the problem. We also show non-trivial lower bounds for the size of a minimum complete test set.