抄録
At-speed scan testing is susceptible to yield loss risk due to power supply noise caused by excessive launch switching activity. This paper proposes a novel two-stage scheme, namely CTX (Clock-Gating-Based Test Relaxation and X-Filling), for reducing switching activity when a test stimulus is launched. Test relaxation and X-filling are conducted (1) to make as many FFs as possible inactive by disabling corresponding clock control signals of clock-gating circuitry in Stage-1 (Clock-Disabling), and (2) to equalize the input and output values in Stage-2of as many remaining active FFs as possible (FF-Silencing). CTX effectively reduces launch switching activity and thus yield loss risk even when only a small number of don't care (X) bits are present (as in test compression) without any impact on test data volume, fault coverage, performance, or circuit design.
