Test Pattern Ordering and Selection for High Quality Test Set under Constraints

Abstract

Nano-scale VLSI design is facing the problems of increased test data volume. Small delay defects are becoming possible sources of test escapes, and high delay test quality and therefore a greater volume of test data are required. The increased test data volume requires more tester memory and test application time, and both result in test cost inflation. Test pattern ordering gives a practical solution to reduce test cost, where test patterns are ordered so that more defects can be detected as early as possible. In this paper, we propose a test pattern ordering method based on SDQL (Statistical Delay Quality Level), which is a measure of delay test quality considering small delay defects. Our proposed method orders test patterns so that SDQL shrinks fast, which means more delay defects can be detected as early as possible. The proposed method efficiently orders test patterns with minimal usage of time-consuming timing-aware fault simulation. Experimental results demonstrate that our method can obtain test pattern ordering within a reasonable time, and also suggest how to prepare test sets suitable as inputs of test pattern ordering.