IEICE Transactions on Information and Systems
Online ISSN : 1745-1361
Print ISSN : 0916-8532
Regular Section
Active Learning for Software Defect Prediction
Guangchun LUOYing MAKe QIN
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JOURNAL FREE ACCESS

2012 Volume E95.D Issue 6 Pages 1680-1683

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Abstract

An active learning method, called Two-stage Active learning algorithm (TAL), is developed for software defect prediction. Combining the clustering and support vector machine techniques, this method improves the performance of the predictor with less labeling effort. Experiments validate its effectiveness.

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© 2012 The Institute of Electronics, Information and Communication Engineers
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