Runtime Tests for Memory Error Handlers of In-memory Key Value Stores using MemFI

抄録

Modern memory devices such as DRAM are prone to errors that occur because of unintended bit flips during their operation. Since memory errors severely impact in-memory key-value stores (KVSes), software mechanisms for hardening them against memory errors are being explored. However, it is hard to efficiently test the memory error handling code due to its characteristics: the code is event-driven, the handlers depend on the memory object, and in-memory KVSes manage various objects in huge memory space. This paper presents MemFI that supports runtime tests for the memory error handlers of in-memory KVSes. Our approach performs the software fault injection of memory errors at the memory object level to trigger the target handler while smoothly carrying out tests on the same running state. To show the effectiveness of MemFI, we integrate error handling mechanisms into a real-world in-memory KVS, memcached 1.6.9 and Redis 6.2.7, and check their behavior using the MemFI prototypes. The results show that the MemFI-based runtime test allows us to check the behavior of the error handling mechanisms. We also show its efficiency by comparing it to other fault injection approaches based on a trial model.