Moire Fringes in Transmission Electron Microscopy

Abstract

Moire fringes are observed when two (or more) crystal lattices are interfered in transmission electron microscopy (TEM). Typical application is the evaluation of epitaxial films grown on a substrate, in where their crystallographic orientation relationship could be investigated. Visualization of defects distribution using Moire fringes are also useful. Sometimes Moire fringes between crystal and digital pixel lattices are intentionally formed to visualize a strain map. In the present paper, some of those applications are introduced.