表面と真空
Online ISSN : 2433-5843
Print ISSN : 2433-5835
特集「二次イオン質量分析法(SIMS)の最近の進歩と有機分析への応用」
真空型エレクトロスプレー液滴イオン銃の開発と飛行時間型二次イオン質量分析への応用
二宮 啓髙木 悠一郎チェン リーチュイン平岡 賢三
著者情報
ジャーナル 認証あり

2018 年 61 巻 7 号 p. 440-445

詳細
抄録

We have developed a vacuum-type electrospray droplet ion (V-EDI) gun as a novel massive cluster beam for surface analysis instruments in which the beam source is a vacuum electrospray of aqueous solution. The prototype of the V-EDI gun was connected to a time-of-flight analyzer. Secondary ion spectra produced by the V-EDI beams were measured using a sample-bias pulsing method, because a short pulse of the beam could not be obtained. The secondary ion yields of biomolecular samples produced by the V-EDI and Bi cluster ion beams were compared, and the secondary ion yields produced with the V-EDI beams were found to be much higher than those produced with the Bi cluster ion beams.

  Fullsize Image
著者関連情報

この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
前の記事 次の記事
feedback
Top