特集「二次元層状物質の成長とその場評価―真空・表面技術による高品質薄膜の実現を目指して―」
低エネルギー電子顕微鏡による二次元層状物質成長のその場評価
2019 年 62 巻 10 号 p. 623-628
詳細
2019 年 62 巻 10 号 p. 623-628
Two-dimensional (2D) materials are attracting intense attention due to their intriguing physical properties and a wide range of potential applications. Cost-efficient methods of growing large-scale, high-quality 2D crystals are requisites for device applications of 2D materials. To establish the growth techniques, understanding of the growth mechanism is important. For this purpose, we have investigated growth processes of 2D materials using in-situ low-energy electron microscopy (LEEM). In this paper, we report LEEM observations of graphene segregation on a polycrystalline Ni foil and silicene growth on a Ag(111) substrate.
