Analysis of Initial Stage in Thin Film Growth of Organic Semiconductor Using Quartz Crystal Microbalance

Abstract

In the thin-film growth of organic semiconductors, understanding the elementary processes is required to control thin-film structures such as molecular orientation and nucleation density. We have used the quartz crystal microbalance (QCM), which is non-destructive and high-sensitivity measurement technique, for the in-situ analysis of initial stage in organic thin-film growth. In this study, we evaluate the initial stage in thin-film growth of pentacene, which is a bench mark material in the organic semiconductors, on a polyimide surface, and discuss the nucleation process considering a meta-stable state.