Ultrahigh-resolution Magnetic Field Imaging by Magnetic-field-free Atomic Resolution Electron Microscopy

Abstract

With conventional atomic-resolution electron microscopes, atomic-scale observation of magnetic materials has been extremely difficult since the samples are inevitably placed in a strong magnetic field of 2 T or higher. To overcome this limitation, we have developed a new objective lens system that enables atomic-resolution observation while maintaining a sample in the magnetic field-free environment. The electron microscope with this new lens system facilitates atomic structure analysis of magnetic materials and is expected to enable ultra-high resolution magnetic field imaging inside materials and devices. In this review, we describe the development of elemental technologies for the Magnetic field-free Atomic-Resolution Scanning transmission electron microscope (MARS) and show the results of real-space observation of the atomic-scale magnetic field distribution inside antiferromagnetic hematite.