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Online ISSN : 2433-5843
Print ISSN : 2433-5835
特集「透過電子顕微鏡の最新の動向」
透過電子顕微鏡におけるスピン偏極パルス電子線を用いた時間分解計測
桑原 真人
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ジャーナル 認証あり

2023 年 66 巻 12 号 p. 711-718

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Time-resolved measurements in transmission electron microscopy (TEM) offer the possibility of revealing ultrafast phenomenon with nanometer spatial resolution, allowing the analysis of nonuniform materials, functional materials, and advanced nano-devices. A high-quality pulsed electron beam, with high brightness, narrow energy width, and high spin-polarization, was realized by installing a semiconductor-type photocathode having a negative electron affinity surface to an electron gun in the TEM system.

We conducted time-resolved measurements of electron energy-loss spectrum with picosecond pulsed electron beam in the TEM, and elucidated electron-phonon and phonon-phonon relaxation processes in photo-excited gold nanoparticles. Furthermore, the intensity interference of charged fermions was realized by temporally modulated spin-polarized electrons. The coherent spin-polarized electron beam facilitates the extraction of intrinsic quantum interference. These application results pave the way for a new analytical method for the ultrafast dynamics of electrons and lattices in materials, in addition to quantum measurements in electron microscopes.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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