Ultrafast Surface Phenomena Studied by Lightwave-driven Scanning Tunneling Microscopy

Abstract

Lightwave-driven scanning tunneling microscopy (STM) that controls tunneling current by electric field of light has attracted much attention to study ultrafast surface phenomena. We generated broadband mid-infrared pulses and combined them to STM. We achieved fastest temporal resolution of 29 fs in lightwave-driven STM. This technique is expected to be a new way to reveal non-equilibrium electronic states in atomic scale.