The purpose of this study is to improve ceramic coatings having a high stable electrostatic adsorption force. The use of the coating is for the Johnsen-Rahbek force type electrostatic chucks used to fix silicon wafers inside vacuum chambers for processes such as Etch, CVD and PVD for semiconductor manufacturers.
Previously the authors developed a dielectric substance ceramic coating for electrostatic chucks using Atmospheric Plasma Spraying (APS). This ceramic coating was not suitable because of its unstable electrostatic adsorption force.
In a subsequent study, Vacuum Plasma Sprayed (VPS) Al
2O
3-7.5mass%TiO
2 coating was investigated. As a result, it was found that the VPS coating has stable electrical resistivity and adsorption force. The dielectric constant of VPS Al
2O
3-TiO
2 coating was sufficient for application to electrostatic chuck.
On the other hand, it was suggested from results with respect to residual adsorption force and duration time after power off that the residual adsorption characteristic was not adequate.
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