With a high voltage electron microscope (HVEM), thick emulsion layers (2-12μ) containing silver halide grains or developed silver filaments in gelatin and, the defect structures in these grains have been observed. HVEM enables us to observe grains or filaments directly through an emulsion layer of 8μ thick at accelerating voltage of 1000 KV. The form of grains in an emulsion layer of 2μ thick were thus observed very clearly.
A very good image quality was also achieved on the observation of dislocations in silver iodobromide grains by the use of HVEM. Furthermore, the conversion of AgBr grains to AcI to some depth of the grain was more clearly observed.
In developed silver filaments, twin boundaries were resolved clearly.
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