Proceeding of Symposium on Reliability

Online ISSN : 2424-2357
ISSN-L : 2424-2357

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[title in Japanese]

Article type: Cover
Pages Cover1-
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_Cover1

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[title in Japanese]

Article type: Appendix
Pages App1-
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_App1

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[title in Japanese]

Article type: Index
Pages Toc1-
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_Toc1

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[title in Japanese]

Article type: Appendix
Pages App2-
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_App2

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[title in Japanese]

[in Japanese]

Article type: Article
Pages 1-4
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_1

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese], [in Japanese]

Article type: Article
Pages 5-8
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_5

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[title in Japanese]

[in Japanese], [in Japanese]

Article type: Article
Pages 9-12
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_9

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[title in Japanese]

[in Japanese], [in Japanese]

Article type: Article
Pages 13-16
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_13

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Influence of hydrogen near the SiO_2/Si interface on long-term reliability of LSI

Ziyuan LIU, Shinji FUJIEDA, Koichi TERASHIMA

Article type: Article
Pages 17-20
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_17

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It was confirmed that negative-bias-temperature stress (NBTS) produces interface states and a post-oxidation annealing (POA) suppresses the interface state production. Hydrogen accumulation to the SiO_2/Si interface is clearly shown to influence the stability of LSI's devices against NBTS.

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese]

Article type: Article
Pages 21-24
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_21

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[title in Japanese]

[in Japanese]

Article type: Article
Pages 25-28
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_25

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[title in Japanese]

[in Japanese]

Article type: Article
Pages 29-32
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_29

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Faulty Diagnosis Technique in Cell Circuit Using I_<DDQ>

Masaru SANADA, Kazuo UEHIRA

Article type: Article
Pages 33-36
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_33

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For fault element diagnosis in cell circuits, two diagnosis techniques have been developed using I_<DDQ>. One is a detection way of shorted pairs in transistor elements. This technique is the way to prepare logic state of six pairs, formed by transistor structure, using the logic applied to transistor terminal. Another is a detection way of shorted line pairs in cell circuit. Transistor is defined to logical element and treats as SPICE data. This operation makes it possible to execute the logic simulation of elements in cell. These data combined with layout information are applied to narrow the shorted pairs down.

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[title in Japanese]

[in Japanese]

Article type: Article
Pages 37-40
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_37

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Article type: Article
Pages 41-44
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_41

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese], [in Japanese]

Article type: Article
Pages 45-48
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_45

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[title in Japanese]

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Article type: Article
Pages 49-52
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_49

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Article type: Article
Pages 53-56
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_53

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese], [in Japanese]

Article type: Article
Pages 57-60
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_57

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[title in Japanese]

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Article type: Article
Pages 61-64
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_61

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japane ...

Article type: Article
Pages 65-68
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_65

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[title in Japanese]

Article type: Cover
Pages Cover2-
Published: October 24, 2003
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajsym.16.0_Cover2

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