2018 年 54 巻 12 号 p. 459-465
Adsorption characteristics of surfactants occurring at solid/liquid interfaces are an important subject notonly in academia but also in industry. Atomic force microscopy (FM) and quartz crystal microbalancewith dissipation monitoring (QCM-D) are useful techniques in order to study the surfactant adsorption onflat solid surfaces. In this review, the basic principle of the two techniques is explained first, and then a fewexperimental topics are presented: (i) adsorption of gemini surfactants,(ii) high-speed AFM monitoring ofsolubilization-induced morphological change in surfactant aggregates adsorbed on solid, and(iii) adsorption ofsurfactants or water at solid /ionic liquid interfaces.